Sep 18, 2023 · This article provides an overview of AFM and its application in surface-topography imaging.

May 14, 2024 · This article discusses the application of AFM in surface topography and morphology analysis, mechanical properties assessment, and chemical composition mapping.

Nov 3, 2023 · Through these mechanisms, precise three-dimensional topography data of the sample surface can be captured. This topography data forms the basis for various …

Atomic Force Microscopy (AFM) provides high-resolution, nanoscale imaging of surface topography, revealing physical, mechanical, and chemical properties of materials. Widely used …

Here, we explore the physics of the subsurface imaging problem and the emerging solutions that offer exceptional potential for visualization. We discuss materials science, electronics, biology, …

Contact EAG for AFM services to assess surface topography of any material, including quantitative measurements and qualitative mapping.

Mar 1, 2000 · Phase-contrast imaging in the tapping mode atomic force microscopy (AFM) is a powerful method in surface characterization. This method can provide fine details about rough …

Measure surface roughness in 3D with high-resolution AFM. Capture topography and texture using various modes and parameters for detailed surface analysis.

AFM is an advanced form of stylus profilometry where an extremely sharp inert tip is scanned over a surface to produce topographical images. When the atoms at the end of the tip …

The main principle of AFM is to cause a micro displacement of the cantilever (which carries the probe) using the atomic forces between the probe tip and the sample, to map the topography …