UC San Francisco researchers have found a way to double doctors’ accuracy in detecting the vast majority of complex fetal heart defects in utero – when interventions could either correct them or ...
Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...
Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...
Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...
CNN and random forest model to detect multiple faults in bifacial PV systems, including dust, shading, aging, and cracks. Using simulated I-V curves and a 180-day synthetic dataset, the model achieved ...
Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...
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